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HIGH: 7.8 CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HDefault status
unaffected
SDM429W
affected
Snapdragon 429 Mobile Platform
affected
WCN3620
affected
WCN3660B
affected
Description
Memory corruption when blob structure is modified by user-space after kernel verification.
Problem types
CWE-367 Time-of-check Time-of-use (TOCTOU) Race Condition
Product status
SDM429W
Snapdragon 429 Mobile Platform
WCN3620
WCN3660B
References
docs.qualcomm.com/...securitybulletin/may-2025-bulletin.html