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Description

Memory corruption while handling test pattern generator IOCTL command.

PUBLISHED Reserved 2024-11-19 | Published 2025-06-03 | Updated 2025-06-03 | Assigner qualcomm




MEDIUM: 6.6CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L

Problem types

CWE-823 Use of Out-of-range Pointer Offset

Product status

Default status
unaffected

SDM429W
affected

Snapdragon 429 Mobile Platform
affected

WCN3620
affected

WCN3660B
affected

References

docs.qualcomm.com/...ecuritybulletin/june-2025-bulletin.html

cve.org (CVE-2024-53017)

nvd.nist.gov (CVE-2024-53017)

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