Description
Memory corruption while processing the TESTPATTERNCONFIG escape path.
Reserved 2025-02-18 | Published 2025-07-08 | Updated 2025-07-08 | Assigner
qualcommHIGH: 7.8CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H
Problem types
CWE-416 Use After Free
Product status
Default status
unaffected
FastConnect 6700
affected
FastConnect 6900
affected
FastConnect 7800
affected
QCM5430
affected
QCM6490
affected
QCS5430
affected
QCS6490
affected
Qualcomm Video Collaboration VC3 Platform
affected
SC8380XP
affected
Snapdragon 7c+ Gen 3 Compute
affected
Snapdragon 8cx Gen 3 Compute Platform (SC8280XP-AB, BB)
affected
WCD9370
affected
WCD9375
affected
WCD9380
affected
WCD9385
affected
WSA8830
affected
WSA8835
affected
WSA8840
affected
WSA8845
affected
WSA8845H
affected
References
docs.qualcomm.com/...ecuritybulletin/july-2025-bulletin.html
cve.org (CVE-2025-27047)
nvd.nist.gov (CVE-2025-27047)
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