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Description

Memory corruption due to global buffer overflow when a test command uses an invalid payload type.

PUBLISHED Reserved 2025-05-06 | Published 2025-09-24 | Updated 2025-09-25 | Assigner qualcomm




HIGH: 7.8CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

Problem types

CWE-126 Buffer Over-read

Product status

Default status
unaffected

FastConnect 6200
affected

FastConnect 6700
affected

FastConnect 7800
affected

QCC5161
affected

QCC710
affected

QCC711
affected

QCC7225
affected

QCC7226
affected

QCC7228
affected

QMP1000
affected

S3 Gen 2 Sound Platform
affected

S3 Sound Platform
affected

S5 Gen 2 Sound Platform
affected

S5 Sound Platform
affected

SM6475
affected

SM6650
affected

SM6650P
affected

SM7435
affected

SM7550
affected

SM7550P
affected

SM7635
affected

SM7635P
affected

SM7675
affected

SM7675P
affected

SM8635
affected

SM8635P
affected

SM8735
affected

SM8750
affected

SM8750P
affected

Snapdragon 6 Gen 1 Mobile Platform
affected

WCD9370
affected

WCD9371
affected

WCD9375
affected

WCD9378
affected

WCD9385
affected

WCD9390
affected

WCD9395
affected

WCN3988
affected

WCN6650
affected

WCN6755
affected

WCN7750
affected

WCN7860
affected

WCN7861
affected

WCN7880
affected

WCN7881
affected

WSA8810
affected

WSA8815
affected

WSA8830
affected

WSA8832
affected

WSA8835
affected

WSA8840
affected

WSA8845
affected

WSA8845H
affected

References

docs.qualcomm.com/...tybulletin/september-2025-bulletin.html

cve.org (CVE-2025-47317)

nvd.nist.gov (CVE-2025-47317)

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