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Description

On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.

PUBLISHED Reserved 2025-08-29 | Published 2025-09-05 | Updated 2025-09-05 | Assigner Toreon




HIGH: 8.6CVSS:4.0/AV:P/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:H/SI:H/SA:H/S:P

Problem types

CWE-1191: On-Chip Debug and Test Interface With Improper Access Control

CWE-1319: Improper Protection against Electromagnetic Fault Injection (EM-FI)

Runtime Hardware Protection Bypass

Product status

Default status
unaffected

Any version
affected

Credits

Milena Mangiola finder

References

raelize.com/...Glitching_devices_for_code_execution_v1.1.pdf

raelize.com/...cs-Misconceptions-and-Weird-Machines_v1.1.pdf

nvd.nist.gov/vuln/detail/CVE-2020-27211

www.toreon.com/...5-9709-major-vulnerability-in-common-chip/

cve.org (CVE-2025-9709)

nvd.nist.gov (CVE-2025-9709)

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